State of the art Field Emission Scanning Electron Microscope capable of resolution down to 1nm. EM Wizard software assists in optimizing and capturing superior images, even for novice users.The SU5000 is equipped with VP capability to deal with sample charging without the requirement for Au coating. The system is equipped with both secondary electron and backscatter electron detectors. There is EDS capability for elemental analysis of samples. The G2N system is equipped with a Life Force Nanomanipulator System.
Features:
ZrO/W Schottky emission electron gun
Magnification: 18-1,500,000X
Resolution: 1.2nm (SE); 2.0nm (BSE)
Accelerating Voltage: 0.1-30kV
Beam Deceleration: -2.5kV-0.1kV
Beam Current: 1pA to >500naA
Everhart-Thornley secondary electron detector
Oxford Instruments UltimMax 100 EDS
5-axis computerized eucentric motorized stage
LF-2000 nanomanipulation system enables simultaneous electrical and mechanical measurements of devices and materials down to the nanometer scale.
Find out what we charge to use Hitachi SU5000 FESEM