@article {shin2015fatigue,
	title = {Fatigue life estimation of vertical probe needle for wafer probing},
	journal = {International Journal of Precision Engineering and Manufacturing},
	volume = {16},
	number = {12},
	year = {2015},
	pages = {2509{\textendash}2515},
	publisher = {Korean Society for Precision Engineering},
	author = {Shin, Bonghun and Kwon, Hyock-Ju and Han, Sang-Wook and Im, Chang Min}
}
