The Quantum Nano Fabrication and Characterization Facility (QNFCF), Transformative Quantum Technologies (TQT), and Testforce will be hosting an Electrical Characterization Seminar joined by a Keithley Applications Engineer, who will explore the challenges and best practices in low current and low voltage measurements using the Keithley 4200A-SCS Parameter Analyzer.
Gain practical insights into optimizing their setups for device characterization, enhancing measurement accuracy, and overcoming noise, leakage, and connection limitations common in lab and wafer-level testing. Whether you’re testing nanoscale devices, advanced semiconductors, or novel materials, this seminar will give you the knowledge to get the most out of your instrumentation.
This seminar is open to students, faculty, and industry professionals.
Lunch will be provided. We hope you will join us. Please register for the event.