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Epitaxial Growth of Silicon Nanowires and Niobium Thin Films for Magnetic Resonance Force Microscopy

Michele Piscitelli

Magnetic Resonance Force Microscopy (MRFM) is an imaging technique enabling the acquisition of magnetic resonance images at nanometer scales. Single electron spin sensitivity has been demonstrated [1] and current MRFM research is focused on working towards achieving single nuclear spin sensitivity. In general, an MRFM setup requires a nano-scale source of high magnetic field gradients to modulate the sample spins and a cantilever-based detection scheme to measure their magnetic moment.