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DTSTART:20130310T070000
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DTSTART:20131103T060000
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UID:69e4ccf69a749
DTSTART;TZID=America/Toronto:20140225T140000
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URL:https://uwaterloo.ca/institute-for-quantum-computing/events/taehyun-yoo
 n-atom-trap-trace-analysis-atta-system-measure
LOCATION:QNC - Quantum Nano Centre 200 University Avenue West 0101 Waterloo
  ON N2L 3G1 Canada
SUMMARY:Taehyun Yoon: An atom trap trace analysis (ATTA) system to measure\
 ntrace contamination by Kr of XENON dark matter detector
CLASS:PUBLIC
DESCRIPTION:TAEHYUN YOON\, COLUMBIA UNIVERSITY\n\nIn the XENON dark matter 
 search experiment\, trace contamination of Xe\nby Kr contributes backgroun
 d events through the beta decay of\nradioactive Kr-85. To achieve the requ
 ired sensitivity of the\ndetector\, the contamination must be reduced belo
 w the part per\ntrillion (ppt) level and this level must be known precisel
 y. We have\ndeveloped an atom trap trace analysis (ATTA) device using stan
 dard\natom cooling and trapping techniques to detect Kr below the ppt leve
 l.
DTSTAMP:20260419T123918Z
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