Magnetic Force Microscopy for Nanoparticle Characterization

TitleMagnetic Force Microscopy for Nanoparticle Characterization
Publication TypeJournal Article
Year of Publication2016
AuthorsCordova, G., B. Y. Lee, and Z. Leonenko
JournalNanoWorld Journal
Volume2
Start Page10
Issue1
Pagination10-14
Date Published04/2016
Keywordsatomic force microscopy, magnetic and superparamagnetic iron oxide nanoparticles (SPIONs), magnetic force microscopy (MFM), MFM Imaging in air and in liquid, nanoparticles
Abstract

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a member of a growing family of scanning probe methods and has been widely used for the study of magnetic materials. In MFM a magnetic probe is used to raster-scan the surface of the sample, of which its magnetic field interacts with the magnetic tip to offer insight into its magnetic properties. This review will focus on the use of MFM in relation to nanoparticle characterization, including superparamagnetic iron oxide nanoparticles, covering MFM imaging in air and in liquid environments.

URLhttp://jnanoworld.com/articles/v2n1/nwj-022-gustavo-cordova.pdf
DOI10.17756/nwj.2016-02
Refereed DesignationRefereed
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