A World-Class Metrology Suite
Situated in the Mike & Ophelia Lazaridis Quantum Nano Centre (QNC) and co-administered by the Waterloo Institute for Nanotechnology (WIN) and the Institute for Quantum Computing (IQC), the QNC Metrology Labs contain a full suite of tools to see, measure, manipulate and build materials at the nanoscale. For information about about the facility, rates or scheduling, please contact Professor Tong Leung at tong@uwaterloo.ca.
Cross-beam focused ion beam scanning electron microscope (FIB-SEM)
Scanning transmission electron microscope (STEM)
Materials research X-ray diffractometer (MRD XRD)
Superconducting quantum interference device (SQUID) very sensitive magnetometer (VSM)
Atomic force microscope (AFM)
Small-angle X-ray scattering (SAXS) device
