Pacific Nanotechnology, Inc. Nano-R AFM.
Specifications
- X-Y scan:
- Range: 80 µm
Linearity: 1%
Resolution: 0.1 nm - Z-scan:
- Range: 8 µm
Resolution: 0.1 nm
Z noise: 0.13 nm (calibration sensors on)
0.07 nm (calibration sensors off) - Colour video microscope:
- Magnification (9" monitor): 1000x
Motorized zoom/focus: 4x
Field of view: 140 µm x 190 µm
Resolution: 1.5 µm - Automated X-Y stage:
- Range: 25.4 x 25.4 mm
Step Size: 3 µm
Slew Rate: 1.2 mm/sec. - Scan modes:
- — Contact mode
— Lateral force mode
— Close-contact mode
— Non-contact mode
— Material sensing mode
— Force/distance mode
