These scans feature zirconium oxide nanomaterials created for applications ranging from green energy to spintronics.
Nanotechnology is enabled by the tools to see, measure and manipulate materials at the nanoscale.
Explore the major tools of the Metrology Suite and their specifications below.
Cross-beam focused ion beam scanning electron microscope (FIB-SEM)
Scanning transmission electron microscope (STEM)
Materials research X-ray diffractometer (MRD XRD)
Superconducting quantum interference device (SQUID) very sensitive magnetometer (VSM)
Atomic force microscope (AFM)
Small-angle X-ray scattering (SAXS) device
