The MultiPrep™ system enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, scanning and transmission electron microscopy, atomic force microscopy, focus ion beam, etc.) evaluation. Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof.
System features and options:
- Variable platen speed
Dual axis, micrometer controlled angular positioning of the sample (pitch and roll): +10° / -2.5° range (0.02° increments)