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DTSTART:20220313T070000
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DTSTART;TZID=America/Toronto:20230106T110000
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URL:https://uwaterloo.ca/systems-design-engineering/events/grad-seminar-ope
 n-loop-transient-atomic-force-microscopy
LOCATION:E5 - Engineering 5 200 University Avenue West 6002 Waterloo ON N2L
  3G1 Canada
SUMMARY:Grad Seminar: Open-loop Transient Atomic Force Microscopy
CLASS:PUBLIC
DESCRIPTION:ABSTRACT\n\nThe Atomic Force Microscope (AFM) is an instrument 
 for measuring\, in\nfact “seeing”\, phenomena at nanoscale (10−9m) a
 nd all the way\ndown to the atomic scale (<10−10m). It was borne out of 
 a need to\nobserve physical reality below the resolution of optical micros
 copes.\nInvented in 1986 by Binnig\, it has aided scientists\, researchers
 \, and\nengineers spanning many scientific and industrial domains. The typ
 ical\nsensing apparatus of the AFM is a very sharp tip (a few atoms wide)\
 nattached to the free-end of a fixed-free micro-beam.
DTSTAMP:20260408T050158Z
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