@inproceedings {527, title = {An automated and rapid defect inspection algorithm for fluorescent PDP patterns}, booktitle = {14th Canadian Conference on Electrical and Computer Engineering}, year = {2001}, abstract = {

Plasma display panels (PDPs) represent the next generation of visual displays in the new century. Relative to traditional CRTs, PDPs offer advantages such as providing clearer images and occupying less space. The quality control of the PDP in the production line is very important to minimize costs and maximize product quality. Although there are several different kinds of patterns that need to be inspected, this research presents algorithms used for fluorescent pattern inspection of PDPs. Here, a complete design and implementation of a sequence of algorithmic components necessary to identify fluorescent pattern PDP defects is described. A primary criterion is that the maximum time allowed for the entire analysis is only a few seconds, so each component must execute rapidly and efficiently
Plasma display panels (PDPs) represent the next generation of visual displays in the new century. Relative to traditional CRTs, PDPs offer advantages such as providing clearer images and occupying less space. The quality control of the PDP in the production line is very important to minimize costs and maximize product quality. Although there are several different kinds of patterns that need to be inspected, this research presents algorithms used for fluorescent pattern inspection of PDPs. Here, a complete design and implementation of a sequence of algorithmic components necessary to identify fluorescent pattern PDP defects is described. A primary criterion is that the maximum time allowed for the entire analysis is only a few seconds, so each component must execute rapidly and efficiently
}, keywords = {automated rapid defect inspection algorithm, automatic optical inspection, costs, flat panel displays, fluorescence, fluorescent pattern inspection, fluorescent PDP patterns, image processing, plasma display panels, plasma displays, product quality, production line, quality control, visual displays}, doi = {http://dx.doi.org/10.1109/CCECE.2001.933685}, author = {R Ge and D A. Clausi} } @inproceedings {534, title = {Morphological skeleton algorithm for PDP production line inspection}, booktitle = {IEEE Canadian Conference on Electrical and Computer Engineering}, year = {2001}, abstract = {

Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper introduces a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system

}, keywords = {automated applications, commercial machine vision system, Computer Vision, continuity checking, defects detection, electrode pattern inspection, Feature Extraction, feature point matching, image matching, image processing, image representation, image thinning, Inspection, Mathematical morphology, morphological skeleton algorithm, PDP inspection, PDP production line inspection, plasma display panel, plasma displays, production, redundant image data reduction, semiconductor device testing, semiconductor inspection, shape analysis, shape representation, single pixel lines, thick-lined images}, doi = {http://dx.doi.org/10.1109/CCECE.2001.933598}, author = {R Ge and D A. Clausi} }