Gianluigi Botton
"Advances in microscopy applications to semiconductor materials and devices"
Dr. Gianluigi Botton has developed advanced techniques for using electron microscopes that provide very high spatial resolution information, including transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). In his program as Canada Research Chair in Electron Microscopy of Nanostructured Materials, Dr. Botton will use TEM/EELS technology to achieve three goals: improve techniques to detect signals from few atomic layers at interfaces and nanostructures; develop models to describe the analytical data in terms of structure and bonding changes; and describe the relationships between the observations and the properties of the materials.
Research Interests Include:
- Microscopy of nanostructured materials
- Transmission electron microscopy
- Electron energy-loss spectroscopy
- Structure-properties in nanoscale materials