Reference author: Sean Kauffman

Moreno, C. ., Kauffman, S. ., & Fischmeister, S. . (2016). Efficient Program Tracing and Monitoring Through Power Consumption — With A Little Help From The Compiler. Proc. Of Design, Automation, and Test (DATE). Presented at the. Dresden, Germany.

Kauffman, S. ., Moreno, C. ., & Fischmeister, S. . (2016). Static Transformation of Power Consumption for Software Attestation. IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA). Presented at the. Daegu, South Korea.

Kauffman, S. ., Havelund, K. ., & Fischmeister, S. . (2021). What Can We Monitor Over Unreliable Channels?. International Journal on Software Tools for Technology Transfer, 23, 579-600. https://doi.org/10.1007/s10009-021-00625-z

Kauffman, S. ., Dunne, M. ., Gracioli, G. ., Khan, W. ., Benann, N. ., & Fischmeister, S. . (2020). Palisade: A Framework for Anomaly Detection in Embedded Systems. Journal of Systems Architecture, 1-17. https://doi.org/10.1016/j.sysarc.2020.101876

Kauffman, S. ., & Fischmeister, S. . (2019). Event Stream Abstraction Using Nfer: Demo Abstract. International Conference on Cyber-Physical Systems, 332 to 333. Montreal, Canada: ACM. https://doi.org/10.1145/3302509.3313327

Kauffman, S. ., Havelund, K. ., & Fischmeister, S. . (2019). Monitorability Over Unreliable Channels. International Conference on Runtime Verification (RV), 256 to 272. Porto, Portugal. https://doi.org/10.1007/978-3-030-32079-9_15

Kauffman, S. ., Havelund, K. ., Joshi, R. ., & Fischmeister, S. . (2018). Inferring Event Stream Abstractions. Formal Methods in System Design, 29. https://doi.org/10.1007/s10703-018-0317-z

Kauffman, S. ., & Fischmeister, S. . (2017). Mining Temporal Intervals from Real-time System Traces. 6th International Workshop on Software Mining. Presented at the. Champaign, USA.

Narayan, A. ., Kauffman, S. ., Morgan, J. ., Tchamgoue, G. M., Joshi, Y. ., Fischmeister, S. ., & Hobbs, C. . (2017). System Call Logs with Natural Random Faults: Experimental Design and Application. Silicon Errors in Logic &Mdash; System Effects (SELSE). Presented at the. Boston, USA.