Moreno, C., Kauffman, S., & Fischmeister, S. (2016). Efficient Program Tracing and Monitoring Through Power Consumption — With A Little Help From The Compiler Presented at the Proc. Of Design, Automation, and Test (DATE) conference. Dresden, Germany.
Reference author: Sean Kauffman
First name
Sean
Last name
Kauffman
Kauffman, S., Moreno, C., & Fischmeister, S. (2016). Static Transformation of Power Consumption for Software Attestation Presented at the IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA) conference. Daegu, South Korea.
Kauffman, S., Havelund, K., & Fischmeister, S. (2021). What Can We Monitor Over Unreliable Channels? International Journal on Software Tools for Technology Transfer, 23, 579-600. https://doi.org/10.1007/s10009-021-00625-z
Kauffman, S., Dunne, M., Gracioli, G., Khan, W., Benann, N., & Fischmeister, S. (2020). Palisade: A Framework for Anomaly Detection in Embedded Systems Journal of Systems Architecture, 1-17. https://doi.org/10.1016/j.sysarc.2020.101876
Kauffman, S., & Fischmeister, S. (2019). Event Stream Abstraction Using Nfer: Demo Abstract International Conference on Cyber-Physical Systems, 332 to 333. Montreal, Canada: ACM. https://doi.org/10.1145/3302509.3313327
Kauffman, S., Havelund, K., & Fischmeister, S. (2019). Monitorability Over Unreliable Channels International Conference on Runtime Verification (RV), 256 to 272. Porto, Portugal. https://doi.org/10.1007/978-3-030-32079-9_15
Kauffman, S., Havelund, K., Joshi, R., & Fischmeister, S. (2018). Inferring Event Stream Abstractions Formal Methods in System Design, 29. https://doi.org/10.1007/s10703-018-0317-z
Kauffman, S., & Fischmeister, S. (2017). Mining Temporal Intervals from Real-time System Traces Presented at the 6th International Workshop on Software Mining conference. Champaign, USA.
Narayan, A., Kauffman, S., Morgan, J., Tchamgoue, G. M., Joshi, Y., Fischmeister, S., & Hobbs, C. (2017). System Call Logs with Natural Random Faults: Experimental Design and Application Presented at the Silicon Errors in Logic &Mdash; System Effects (SELSE) conference. Boston, USA.