Joshi, Y., Tchamgoue, G. M., & Fischmeister, S. (2017). Runtime Verification of LTL on Lossy Traces 32nd ACM Symposium on Applied Computing (SAC), 1379-1386. Marrakech, Morocco. https://doi.org/10.1145/3019612.3019827
References
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2017
Narayan, A., Benann, N., & Fischmeister, S. (2017). Mining Specifications using Nested Words Presented at the Proceedings of the 6th International Workshop on Software Mining conference. Urbana-Champaign, USA.
Moreno, C., & Fischmeister, S. (2017). Accurate Measurement of Small Execution Times - Getting Around Measurement Errors N/A.
Moreno, C., & Fischmeister, S. (2017). On the Security of Safety-Critical Embedded Systems: Who Watches the Watchers? Who Reprograms the Watchers? Presented at the International Conference on Information Systems Security and Privacy (ICISSP) conference. Porto, Portugal.
Kauffman, S., & Fischmeister, S. (2017). Mining Temporal Intervals from Real-time System Traces Presented at the 6th International Workshop on Software Mining conference. Champaign, USA.
Moreno, C., & Fischmeister, S. (2017). Accurate Measurement of Small Execution Times — Getting Around Measurement Errors Embedded Systems Letters (ESL).
Narayan, A., Kauffman, S., Morgan, J., Tchamgoue, G. M., Joshi, Y., Fischmeister, S., & Hobbs, C. (2017). System Call Logs with Natural Random Faults: Experimental Design and Application Presented at the Silicon Errors in Logic &Mdash; System Effects (SELSE) conference. Boston, USA.
Iegorov, O., Torres, R., & Fischmeister, S. (2017). Periodic Task Mining in Embedded System Traces IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS), 331-340. Pittsburgh, USA. https://doi.org/10.1109/RTAS.2017.5
Arafa, P., Solomon, D., Navabpour, S., & Fischmeister, S. (2017). Debugging Behaviour of Embedded-Software Developers: An Exploratory Study Presented at the IEEE Symposium on Visual Languages and Human-Centric Computing (VL HCC) conference. Raleigh, USA.
Carvajal, G., Salem, M., Benann, N., & Fischmeister, S. (2017). Enabling Rapid Construction of Arrival Curves From Execution Traces IEEE Design & Test, PP. https://doi.org/10.1109/MDAT.2017.2771210