A versatile and highly advanced x-ray diffractometer incorporating the 2D EIGER detector can readily be configured for a variety of of experimental setups to analyze a plethora of samples.
High resolution and fast measurements can be done, including, but not limited to:
- Texture (preferred orientation)
- Grazing incidence wide angle [GIWAXS] measurement (thin films and coatings)
- Residual stress
- X,Y,Z-mapping- 0.1 mm lateral resolution
- Bulk and powder diffraction
- Transmission XRD experiments
Find out the costs to use the Bruker D8 Discover X-ray Diffraction Spectrometer