Oxygen Free Synthesis Techniques
Double Glove Box
![Double glove box](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/glovebox.jpg?itok=0qHGIarl)
Working Under Inert Gas Atmosphere
Vacuum Line
![Vacuum line](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/picture1.jpg?itok=JExUDbpy)
Evacuating of sample vessels
High Temperature Synthesis Techniques
Arc furnace
![Arc furnace](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/arc.jpg?itok=Sh3IMn9m)
Fast melting > 2000°C for a few seconds
Induction furnace
![induction furnace](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/induction.jpg?itok=K02ymRks)
Controlled annealing between 900°C and 2000°C for some hours
High temperature resistance furnace
![High temperature resistant furnace.](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/hightemp.jpg?itok=7-EHlib0)
Controlled annealing below 1700°C for days or weeks
Resistance Furnaces
![Resistant furnaces](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/resistant.png?itok=DwwhNJg7)
Controlled annealing below 1100°C for days or weeks
Consolidation techniques
![Controlled Pressing With 30 Tons Below 1600°C For Hours](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/consolidation-pressing.jpg?itok=z5EWCno9)
Controlled pressing with 30 tons below 1600°C for hours
![Controlled pressing at room temperature for hours](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/consolidation-pressing-2_0.jpg?itok=qHZMrFB8)
Controlled pressing at room temperature for hours
Analysis
Optical Microscope
![Optical microscope](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/optical-micr.jpg?itok=w-u6g-mN)
Visual control and selection
Powder diffractometer with furnace (inel)
![Powder DiffractometerWith Furnace (inel)](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/powder-diffractometer.jpg?itok=gABOlpNF)
Collection of powder diffraction data for phase analysis
Additional equipment
- University of Waterloo - Single Crystal X-Ray Diffraction (Bruker AXS)
- WATLabs - Scanning Electron Microscope (LEO) With EDX, Imaging ESCA Microprobe System (VG)
Physical Property Measurements
Simultaneous Seebeck and Electrical Conductivity Measurements (ULVAC)
![Simultaneous Seebeck and Electrical Conductivity Measurements (ULVAC)](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/seebeck.jpg?itok=50GpDUDj)
Measurements between 25°C and 1000°C
Thermal Analysis (Netzsch)
![Thermal analysis in the lab](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/thermal-analysis.jpg?itok=fxoVjI29)
Determining DSC and TG between 25°C and 1500°C
Thermal Conductivity Measurements (Anter)
![Thermal conductivity measurements (Anter) in the lab](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/seebeck2.jpg?itok=2fgqUrIr)
Determining thermal conductivity between 25°C and 1000°C
Seebeck Measurements (MMR)
![Seebeck Measurements (MMR)](/kleinke-lab/sites/default/files/styles/large/public/uploads/images/seebeck-3.jpg?itok=lkMve01B)
Determining seebeck coefficient between 25°C and 300°C