Karim Sallaudin Karim, PEng

Dr. Karim S. Karim is a Professor in the Department of Electrical and Computer Engineering at the University of Waterloo. He has secured more than $15M in research grant funding, trained over 40 PhD and MASc students, and has co-authored 250+ publications and 50+ patents.

He is a founder and Chief Technology Officer of KA Imaging, a University of Waterloo spinoff company that makes innovative X-ray detectors and systems for medical, veterinary, scientific and industrial markets. Dr. Karim has developed novel imaging devices and systems since 1998, and has both supported and founded multiple startups over the past two decades. One of his “color” X-ray innovations is now starting to replace black and white medical X-ray globally, while another is used in ultrasonic fingerprint sensors in mobile phones and tablets.

• Spectral X-ray Imaging
• Phase Contrast X-ray Imaging
• Medical Imaging
• Large area electronics
• Semiconductor Devices and Fabrication

• 2012, Masters of Business Administration, University of Toronto, Canada
• 2002, Doctorate Electrical Engineering, University of Waterloo, Canada
• 1999, Bachelor of Applied Science Computer Engineering, University of Waterloo, Ontario

• 2022 Fellow Canadian Academy of Engineering
• 2021 Fellow Engineering Institute of Canada
• 2019 Lazaridis Institute Top 10 scale-ups in Canada
• 2016 Grand Challenges Canada Global Health Challenges Translation to Scale $1M Award
• 2009 CIHR Science to Business (S2B) Award
• 2004 NSERC Doctoral Prize
• 2003 Colton Medal

• 2017 Associate Dean, Engineering Outreach
• 2020 Executive Director, Centre for Bioengineering and Biotechnology
• 2022 Associate Vice President, Commercialization and Entrepreneurship

• IEEE
• AAPM

• Martuza, Muhammad A and Ghanbarzadeh, Sina and Lee, Czang-Ho and Con, Celal and Karim, Karim S, Nanocrystalline silicon lateral MSM photodetector for infrared sensing applications, IEEE Transactions on Electron Devices, 584, 2018
• Karim, Karim S and Nathan, Arokia and Hack, Michael and Milne, William I, Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs, IEEE Electron Device Letters, 188, 2004
• Karim, Karim S and Nathan, Arokia and Rowlands, John Alan, Amorphous silicon active pixel sensor readout circuit for digital imaging, IEEE transactions on electron devices, 200, 2003
• Maurino, Sebastian Lopez and Badano, Aldo and Cunningham, Ian A and Karim, Karim S, Theoretical and Monte Carlo optimization of a stacked three-layer at-panel x-ray imager for applications in multi-spectral diagnostic medical imaging, SPIE Medical Imaging, , 2016
• Scott, CC and Parsafar, A and El-Falou, A and Levine, PM and Karim, KS, High dose efficiency, ultra-high resolution amorphous selenium/CMOS hybrid digital X-ray imager, 2015 IEEE International Electron Devices Meeting (IEDM), 30, 2015

• Alumni's X-ray imaging tech improves remote health care delivery
• Prof develops global X-ray standard for early disease detection
• Honoured for their outstanding contributions
• Waterloo spinoff company wins Health Canada licence for innovative X-ray technology
• Four alumni firms win government support to expand
• Prof named new head of research, innovation centre