Too Many Relevants: Whither Cranfield Test Collections?

TitleToo Many Relevants: Whither Cranfield Test Collections?
Publication TypeConference Paper
Year of Publication2022
AuthorsVoorhees, E. M., N. Craswell, and J. Lin
Conference NameInternational Conference on Research and Development in Information Retrieval (SIGIR)
DOI10.1145/3477495.3531728