Title | Too Many Relevants: Whither Cranfield Test Collections? |
Publication Type | Conference Paper |
Year of Publication | 2022 |
Authors | Voorhees, E. M., N. Craswell, and J. Lin |
Conference Name | International Conference on Research and Development in Information Retrieval (SIGIR) |
DOI | 10.1145/3477495.3531728 |