Hyoung-Joon Kim

Research Associate

Affiliations

Centre for Advanced Materials Joining

Department of Mechanical and Mechatronics Engineering
University of Waterloo
200 University Ave West
Waterloo, Ontario N2L 3G1
Canada

Contact Information

Phone: (519)-888-4567, ext. 38579
Office: E2-4403
Email: hjkim76@uwaterloo.ca

Biographical Information

2009 to present: Research Associate, Centre for Advanced Materials Joining, University of Waterloo

2008 to 2009: Research Associate, State University of New York at Binghamton, Binghamton, USA

2007 to 2008: Postdoctoral fellow, Institute of Applied Science, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea

2007: PhD, Department of Materials Science and Engineering, KAIST, Daejeon, Republic of Korea

2002: MSc, Department of Materials Science and Engineering, KAIST, Daejeon, Republic of Korea

2000: BSc, Department of Materials Science and Engineering, KAIST, Daejeon, Republic of Korea

Research Interests

  • Flip chip (solder or non-solder)
    • Assembly, characterization, and reliability assessment of COB, COG, and COF
    • Interfacial reactions and reliability assessment
  • Wafer-level packaging
    • Process, characterization, and reliability assessment
  • Epoxy & acrylate-based conductive adhesives
    • Synthesis of ACF, ACP, and NCP
    • Ultrasound aided fast adhesive bonding at low temperature (less than 100ºC)
  • Wire bonding
    • Interfacial reaction and reliability of Au wire/Al pad and Cu wire/Al pad system
    • Electromigration & current carrying capability
  • Nanomaterials fabrication for flexible electronics
    • Growth and fabrication of solution-processed ZnO and TiO2 nanorods, nanoparticles
    • Thin film transistor and photovoltaic cell fabrication and characterization

Selected Publications

  • H. J. Kim, and K. W. Paik, “Adhesion and Reliability of Anisotropic Conductive Films (ACFs) on Organic Solderability Preservatives (OSPs)”, Journal of Electronic Materials, Vol. 37, No. 7, pp. 1003-1011 (2008)
  • H. J. Kim, J. S. Cho, Y. J. Park, J. Lee, and K. W. Paik, “Effects of Pd Addition on Au Stud Bumps/Al Pads Interfacial Reactions and Bond Reliability”, Journal of Electronic Materials, Vol. 33, No. 10, pp. 1210-1218 (2004)
  • H. J. Kim, C. K. Chung, Y. M. kwon, M. J. Yim, S. M. Hong, S. Y. Jang, Y. J. Moon, and K. W. Paik, “Study of the Formation of Bubbles in Rigid-Flexible Substrates Bonding using Anisotropic Conductive Films (ACFs) and the Bubbles Effects on ACF Joints Reliability”, Journal of Electronic Materials, Vol. 36, No. 1, pp. 56-64 (2007)
  • K. W. Lee, H. J. Kim, M. J. Yim, and K. W. Paik, “Ultrasonic Bonding using Anisotropic Conductive Films (ACFs) for Flip Chip Interconnection”, IEEE Transaction on Electronics Packaging & Manufacturing, Vol. 32, No. 4, pp. 241-247 (2009)