Near-field Scattering Tomography Systems for Object Imaging and Material Characterization
Electromagnetic inverse scattering based permittivity profile estimation is one of the most promising techniques for object imaging and material characterization today. Measured in the near-field region in the millimeter and sub-millimeter wavelength range, the scattered field is used to reconstruct the Object Under Test (OUT) cross section and to estimate the electromagnetic properties of the OUT by solving electromagnetic inverse source and scattering problems.
The developed system can be used for online quality control in pharmaceutical manufacturing, medical imaging, model identification, and computer diagnosis of multi-parameter systems.
