Reference author: P Zavracky

First name

P

Last name

Zavracky

Abramson, A. ., Nieva, P. ., Tada, H. ., Zavracky, P. ., Miaoulis, I. ., & Wong, P. . (1999). Effect of doping level during rapid thermal processing of multilayer structures. Journal of Materials Research, 14, 2402-2410.

Tada, H. ., Nieva, P. ., Zavracky, P. ., Miaoulis, I. ., & Wong, P. . (1998). Determining the high-temperature properties of thin films using bilayered cantilevers. MRS Online Proceedings Library (OPL), 546.

Tada, H. ., Abramson, A. ., Nieva, P. ., Zavracky, P. ., Miaoulis, I. ., & Wong, P. . (1998). MEMS as Temperature Sensors During High Temperature Processing. MRS Online Proceedings Library Archive, 518.

Abramson, A. ., Tadal, H. ., Nieva, P. ., Zavracky, P. ., Miaoulis, I. ., & Wong, P. . (1998). Partial Transparency Effects of Silicon During Rapid Thermal Processing. MRS Online Proceedings Library (OPL), 525.