You are here

An automated and rapid defect inspection algorithm for fluorescent PDP patterns

TitleAn automated and rapid defect inspection algorithm for fluorescent PDP patterns
Publication TypeConference Paper
Year of Publication2001
AuthorsGe, R., and D. A. Clausi
Conference Name14th Canadian Conference on Electrical and Computer Engineering
Keywordsautomated rapid defect inspection algorithm, automatic optical inspection, costs, flat panel displays, fluorescence, fluorescent pattern inspection, fluorescent PDP patterns, image processing, plasma display panels, plasma displays, product quality, production line, quality control, visual displays
Abstract

Plasma display panels (PDPs) represent the next generation of visual displays in the new century. Relative to traditional CRTs, PDPs offer advantages such as providing clearer images and occupying less space. The quality control of the PDP in the production line is very important to minimize costs and maximize product quality. Although there are several different kinds of patterns that need to be inspected, this research presents algorithms used for fluorescent pattern inspection of PDPs. Here, a complete design and implementation of a sequence of algorithmic components necessary to identify fluorescent pattern PDP defects is described. A primary criterion is that the maximum time allowed for the entire analysis is only a few seconds, so each component must execute rapidly and efficiently

Plasma display panels (PDPs) represent the next generation of visual displays in the new century. Relative to traditional CRTs, PDPs offer advantages such as providing clearer images and occupying less space. The quality control of the PDP in the production line is very important to minimize costs and maximize product quality. Although there are several different kinds of patterns that need to be inspected, this research presents algorithms used for fluorescent pattern inspection of PDPs. Here, a complete design and implementation of a sequence of algorithmic components necessary to identify fluorescent pattern PDP defects is described. A primary criterion is that the maximum time allowed for the entire analysis is only a few seconds, so each component must execute rapidly and efficiently
DOI10.1109/CCECE.2001.933685