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Bayesian-based aberration corection and numerical diffraction for improved lensfree on-chip microscopy of biological specimens

TitleBayesian-based aberration corection and numerical diffraction for improved lensfree on-chip microscopy of biological specimens
Publication TypeJournal Article
Year of Publication2015
AuthorsWong, A., F. Kazemzadeh, C. Jin, and Z. Wang
JournalOptics Letters
DOI10.1364/OL.40.002233