Bayesian-based aberration correction and numerical diffraction for improved lensfree on-chip microscopy of biological specimens

TitleBayesian-based aberration correction and numerical diffraction for improved lensfree on-chip microscopy of biological specimens
Publication TypeJournal Article
Year of Publication2015
AuthorsWong, A., F. Kazemzadeh, C. Jin, and X. Yu Wang
JournalOptics Letters
Volume40
Pagination2233–2236