| Title | Morphological skeleton algorithm for PDP production line inspection |
| Publication Type | Conference Paper |
| Year of Publication | 2001 |
| Authors | Ge, R., and D. A. Clausi |
| Conference Name | IEEE Canadian Conference on Electrical and Computer Engineering |
| Keywords | automated applications, commercial machine vision system, Computer Vision, continuity checking, defects detection, electrode pattern inspection, Feature Extraction, feature point matching, image matching, image processing, image representation, image thinning, Inspection, Mathematical morphology, morphological skeleton algorithm, PDP inspection, PDP production line inspection, plasma display panel, plasma displays, production, redundant image data reduction, semiconductor device testing, semiconductor inspection, shape analysis, shape representation, single pixel lines, thick-lined images |
| Abstract | Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper introduces a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system |
| DOI | 10.1109/CCECE.2001.933598 |
