Speaker: Dr. Karim Karim, Professor, Electrical and Computer Engineering; CTO, KA Imaging
- CREATE students receive a 1 hour Design Training Module credit.
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Abstract: A new stacked three-layer flat-panel x-ray detector design is proposed for dual-energy (DE) imaging. Each layer consists of its own scintillator of individual thickness and an underlying thin-film-transistor-based flat-panel.
Three images are obtained simultaneously in the detector during the same x-ray exposure, thereby eliminating any motion artifacts. The detector operation is two-fold: a conventional radiography image can be obtained by combining all three layers’ images, while a DE subtraction image can be obtained from the front and back layers’ images, where the middle layer acts as a mid-filter that helps achieve spectral separation. This device was designed and built at KA Imaging and is currently undergoing clinical trial on lung cancer patients at Grand River Hospital where it is used to differentiate between soft tissue tumors and calcified nodules. Given initial results, the three-layer stacked detector approach appears promising to usher in a new generation of diagnostic x-ray imaging.
Bio: Karim S. Karim is a Professor in the Department of Electrical and Computer Engineering at the University of Waterloo and the CTO of KA Imaging. He has developed devices, circuits and systems for digital X-ray imaging over the past 20 years. To date, he has trained more than 40 graduate students, co-authored 200 publications and has over 40 patents. In 2015, he founded KA Imaging, a Canadian manufacturer of X-ray imaging equipment that is now commercializing large area, spectral digital radiography (DR) detector technology.
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