Tuesday, October 29, 2024 (all day)

Transmission Electron Microscopy (TEM) Open House

Transmission Electron Microscopy (TEM) Open House

Date: Tuesday, October 29, 2024, 9:00 AM – 3:00 PM

The Quantum Nano Fabrication and Characterization Facility (QNFCF) and Transformative Quantum Technologies (TQT) will be hosting a Transmission Electron Microscopy (TEM) Open House on Tuesday, October 29, 9:00 am - 3:00 pm at QNC 0101 to celebrate one year since the launch of the QNFCF's advanced S/TEM capabilities.

The morning will start with a series of engaging presentations covering the latest advancements in TEM technology, sample preparation techniques, and data analysis methods. Speakers will include QNFCF staff and expert engineers from JEOL and Gatan. Following the talks, there will be opportunities to tour our metrology facility to explore advanced instrumentation and learn about the processes involved in sample preparation and characterization.

In the afternoon, participants will have opportunities to attend live TEM sessions hosted by Nicki Shaw and JEOL engineer Dr. Patrick Phillips. Please register for the event below.

Light refreshments and lunch will be provided.

Register here

Registration is now full


Schedule:

9:00 AM - 11:00 AM | Presentations

Location: QNC 0101

Topics: TEM, STEM, EELS, EDS, FIB, 4D STEM

Scope: Applications in nanoparticles, batteries, semiconductors, metals, and quantum materials.

Presentation Schedule
Time Presentation Title Presenter
9:00 AM Opening remarks  
9:05 AM Introduction to TEM and the QNFCF Metrology Facility. Nicki Shaw (QNFCF)
9:20 AM Detector Innovations for EM Applications. Dr. Stephen Mick (Gatan)
9:35 AM Pushing the Imaging and Analytical Boundaries of the Uncorrected JEOL JEM-F200. Kevin Mcilwrath (JEOL)
9:50 AM 10 min break  
10:00 AM

Crystallography, Chemistry, and Electronic Structure with 4D-STEM and EELS.

Dr. Andrew Thron (Gatan)

10:15 AM
10:30 AM A new FIB-SEM for Advanced Specimen Preparation and Characterization. Dr. Patrick Phillips (JEOL)
10:45 AM Extended Capabilities of FIB-SEM. Dr. Greg Holloway (QNFCF)

11:00 AM - 12:00 PM | Lunch and Networking Session

12:00 PM - 1:00 PM | Tours

Location: QNC metrology

  • Tours will include the sample preparation, TEM, and FIB laboratories.

1:00 PM - 3:00 PM | Live Sessions

Location: QNC B709

Watch a live TEM session, showcasing nanoparticle and lamella samples.

Space is limited.

  • 1:00 PM - Session 1: Catalytic nanoparticles sample
  • 2:00 PM - Session 2: Semiconductor device lamella sample

This event is made possible through generous support from JEOL.

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