Vendor: Bruker
Model: Senterra II
Purpose: Used to measure, map and analyze Raman spectra on air-sensitive samples.
Equipment description:
The SENTERRA II is a compact confocal Raman microscope system designed with a high degree of automation, sensitivity, and spatial resolution.
Raman spectroscopy is a non-destructive analytical technique that uses inelastic light scattering from a laser to probe the vibrational, rotational, and other low-frequency modes of a material. This inelastic scattering, known as the Raman effect, provides a unique chemical and structural "fingerprint" of a sample, allowing for its identification and characterization.
Sub-micron chemical mapping functionality allows for the visualization of the distribution of different phases, layers, strain, or defects across various material systems. Integrated in a dry nitrogen glovebox, the SENTERRA II in RAC 1 is an ideal instrument for the in-depth characterization needed to understand the physical, chemical, and electronic properties of air-sensitive materials.
System features and options:
- Choice of 4 X, 20 X, 50 X, 100 X objectives
- Dual wavelength excitation: 785nm (100mW) and 532nm (25mW)
- Laser power control: 100%, 50%, 25%, 10%, 1%
- High precision motorized 50 mm X 75 mm sample stage with 50 nm minimum step width
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Choice of two gratings for high resolution (1200 l/mm) or wide spectral range (400 l/mm)
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Integrated half-waveplate and analyzer for polarization dependent measurements on 532 nm laser line
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Optional photoluminescence mode
