Vendor: Leica
Model: EM TXP
Purpose: Mechanical milling, sawing, grinding and polishing of samples for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and light microscopy(LM)
Equipment description:
EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets. With the specimen pivot arm, the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
System features:
- Integrated automatic process control
- Surface finish and target examination
- Variety of tool inserts
- Inspection of multilayer samples
