Vendor: Leica
Model: EM RES102
Purpose: Sample preparation and precision micro-milling of various solid materials for transmission electron microscopy (TEM) and scanning electron microscopy (SEM)
Equipment description:
The Leica EM RES102 can be used to thin, clean and polish samples for TEM or SEM imaging. A variety of sample holders are available to enable processing of samples for both SEM and TEM applications. A variety of beam energies may be used to accommodate different sample preparation needs.
System features:
- Multiple sample holders for SEM and TEM sample preparation
- Integrated applications library
- Programmable process parameters
