Candidate: Srijan Pabbi
Date: December 1, 2023
Time: 11:00 AM - 12:00 PM
Location: E5 5047
Supervisor(s): Sebastian Fischmeister
Abstract:
The electronics manufacturing and supply industry is rife with the unchecked circulation
of counterfeit and tampered components. Although developments have been made to
counter this issue, the methods often involve visual analysis, X-ray imaging, destructive
testing or extensive functional verification of individual components. Applying one or more
of these solutions to verify electronic components requires a significant investment in time
and capital.
In this thesis, we present a statistical evaluation of SilGeo, a non-intrusive counterfeit
electronics detection technology presented by Moreno et al. The primary purpose of this
evaluation is to progress towards transforming SilGeo from a successful research result into
a standardised verification method in industry applications.
Considering SilGeo as a measurement system, we focus on quantifying the variability
due to the hardware assembly and determining repeatability and reproducibility. We use
Design of Experiments concepts and hardware domain knowledge to identify main effects
and generate assembly configurations to be tested. Accordingly, we apply the statistical
technique analysis of variance (ANOVA) to obtain the variability results with individual
factor contributions.