Speaker
Daniel
Janse
van
Rensburg
Sales
&
Marketing
Manager
Nearfield
Systems
Inc.
Title
An Overview of Near-Field Test Technology
Abstract
This presentation will provide a brief overview of antenna test technology and how these methods evolved to the near-field test systems as they exist today. The fundamental principles of near-field testing will be described and linked to the actual implementation as seen in industry today. Some of the fundamental limitations that restrict application of the techniques will also be reviewed and potential future development will be highlighted. Special attention will be focussed on the extremes of the frequency spectrum and how these very low and/or very high frequencies drive test system development today. A description of the CIARS antenna test facilities will be given and how these fit into the framework of a multi-purpose research capability.
Speaker's biography
Dr Janse van Rensburg has been working in the microwave test industry for 25 years, both as user and supplier of automated antenna test systems. His particular fields of interest are measurement error analysis & computational electromagnetic modelling. He graduated from the University of Pretoria, South Africa and was awarded the B. Eng (cum laude), M. Eng and Ph.D. degrees in 1985, 1987 and 1991 respectively, all in Electrical Engineering.
He joined the Canadian Space Agency in Ottawa, ON as research engineer in 1994 and in 1996 he joined COMDEV’s Space Division in Cambridge, ON. Since 1997 he has been working as engineering consultant in Ottawa, ON, specializing in antenna measurement systems. During this period he has principally worked for Nearfield Systems Incorporated of Torrance, CA, USA and has been instrumental in the design and implementation of custom test systems world-wide. He is also actively involved in academia and was appointed as adjunct professor in the School of Information Technology and Engineering, University of Ottawa in 2005. He is a Senior Member of the IEEE, Fellow of the Antenna Measurement Techniques Association (AMTA) and Licensed Professional Engineer in Ontario, Canada. He served on the AMTA board of directors from 2005 – 2008 and as President in 2007. He is the author of more than 60 journal and conference papers and annually presents industry courses on near-field test technology.
Invited by professors S. Safavi-Naeini and S. Chaudhuri