ECE 730 Topic 9 - VLSI Quality, Reliability and Yield Engineering
Instructor
Calendar Description
This course covers issues concerning VLSI quality and reliability. Topics covered are, overview of VLSI quality and reliability trends; basic reliability concepts; causes of reliability failures; quality, reliability improvement techniques and measures.
Prerequisite
ECE 445
Detailed description
Course content | Lecture hours |
---|---|
Introduction
and
Basic
Concepts
| 3 |
Reliability
Concepts
and
modeling
| 3 |
Defect
monitoring
and
yield
engineering
| 6 |
Electrical
Overstress
and
Electrostatic
Discharge
| 6 |
Gate
Oxide
Breakdown
| 4 |
Electo-migration
| 4 |
Soft
Errors
| 6 |
Functional
Yield
Modeling
| 4 |
Total lecture hours: 36
Project
An individual project is an essential component of this course.