The Metrology Facility in the Quantum Nano Centre contains a full suite of tools to see, measure, manipulate and build materials at the nanoscale. Molecular beam epitaxy, focussed ion beam transmission microscopy, atomic force microscopy, very sensitive magnetometry, and x-ray diffraction are just a few of the shared, state-of-the art techniques available to nano researchers.
The Metrology Facility is located on the floor below the Quantum NanoFab. Together, they form a state-of-the-art nano materials characterization and fabrication platform.
Access is granted to Waterloo Institute for Nanotechnology (WIN) and Institute for Quantum Computing (IQC) faculty members and their students, as well as industrial users. Training and certification is required, and moderate user fees are applicable.
