Seminar - High-Frequency Noise Modeling and Characterization of Nanoscale MOSFETs
Speaker: Xuesong Chen, Ph.D.
Topic: High-Frequency Noise Modeling and Characterization of Nanoscale MOSFETs
Date: Thursday Feb 1, 2018
Time: 2:00pm – 3:00pm
Location: E5-4047
Invited by Professors Lan Wei and Slim Boumaiza