Manoj Sachdev, PEng
Professor, Acting Associate Dean, Research and External Partnerships
Location: E5 4027
Phone: 519-888-4567 x33370


Manoj Sachdev is a Professor in the Department of Electrical and Computer Engineering at the University of Waterloo. His research interests include low power and high performance digital circuit design, mixed-signal circuit design, and test and manufacturing issues of integrated circuits. He has contributed to over 180 conference and journal publications, and has written 5 books. He also holds more than 30 granted US patents.
Professor Sachdev, along with his students and colleagues, have received several international research awards. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), and Fellow of the Engineering Institute of Canada. Professor Sachdev serves on the editorial board of the Journal of Electronic Testing: Theory and Applications. He is also a member of program of IEEE Custom Integrated Circuits Conference.

Research Interests

  • Digital circuit design for low power, low voltage applications, High performance mixed-signal circuit design, Robust design practices for VLSI, VLSI testing and design, VLSI quality, VLSI reliability, VLSI improvement techniques, Circuits Design & VLSI, Cybersecurity, Application security, Network security,


  • 1996, Doctorate Electrical Engineering, Brunel University, United Kingdom
  • 1984, Bachelor of Engineering Electronics and Communication, University of Roorkee, India


  • 1997 Best Paper Award in European Design and Test Conference
  • 1998 Honorable Mention Award in International Test Conference


  • ECE 637 - Digital Integrated Circuits
    • Taught in 2019, 2020, 2021, 2022

* Only courses taught in the past 5 years are displayed.

Selected/Recent Publications

  • Blackmore, Ewart and Trinczek, Michael and Jiang, Kai and Sachdev, Manoj and Wright, Derek, SRAM Dosimeter for Characterizing the TRIUMF Proton and Neutron Beams, IEEE Transactions on Nuclear Science, , 2018
  • Neale, Adam and Sachdev, Manoj, Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS, IEEE Transactions on Nuclear Science, 1912, 2016
  • Papadopoulos, Nikolas P and Lee, Czang-Ho and Sachdev, Manoj and Wong, William S, Paper No P24: Effect of Mechanical Strain on Charge-Transfer VT-Shift Compensation Circuits for Flexible AMOLED Displays, SID Symposium Digest of Technical Papers, 91, 2015
  • Neale, Adam and Jonkman, Maarten and Sachdev, Manoj, Adjacent-mbu-tolerant sec-ded-taec-yaed codes for embedded SRAMs, IEEE Transactions on Circuits and Systems II: Express Briefs, 387, 2015
  • Shah, Jaspal Singh and Nairn, David and Sachdev, Manoj, A 32 kb Macro with 8T Soft Error Robust, SRAM Cell in 65-nm CMOS, IEEE Transactions on Nuclear Science, 1367, 2015
  • Pierce, I and Chuang, Jen and Sachdev, Manoj and Gaudet, Vincent C, A 167-ps 2.34-mW Single-Cycle 64-Bit Binary Tree Comparator With Constant-Delay Logic in 65-nm CMOS, IEEE Transactions on Circuits and Systems I: Regular Papers, 160, 2014
  • Mohan, Nitin and Fung, Wilson and Wright, Derek and Sachdev, Manoj, A low-power ternary CAM with positive-feedback match-line sense amplifiers, IEEE Transactions on Circuits and Systems I: Regular Papers, 566, 2009

Graduate Studies