MASc Seminar: Understanding the Impact of Solvents and Solution-Coated Hole Injection Layers on the Electroluminescent Lifetime of Organic Light-Emitting DevicesExport this event to calendar

Tuesday, April 30, 2019 — 2:00 PM EDT

Candidate: Elizabeth Salsberg

Title: Understanding the Impact of Solvents and Solution-Coated Hole Injection Layers on the Electroluminescent Lifetime of Organic Light-Emitting Devices

 

Date: April 30, 2019

Time: 2:00 PM

Place: E5 4047

Supervisor(s): Aziz, Hany

 

Abstract:

Since their invention over three decades ago, organic light-emitting devices (OLEDs) have attracted tremendous interest for display and solid-state lighting applications and have already been commercialized in smartphones, tablets and television screens. However, the most coveted potential of OLED technology is to enable ultra-low cost, roll-to-roll manufacturing of large-area panels on flexible substrates. To date, commercial OLED products rely on high-cost vacuum deposition techniques and thus fail to realize this potential. In particular, the lifetime, of solution-based (and thus printable) devices remains well below commercially acceptable standards.

The significant lifetime limitations of solution-based devices demand a more thorough understanding of the impact of the unique factors involved in the fabrication of these devices. Solution-processed hole injection layers (HILs), solvents, and heat or drying treatments are three such factors that play a crucial role in solution-processed devices. The principle aim of this work is to understand the influence of these factors on OLED lifetime and demonstrate proof-of-concept strategies to mitigate potentially adverse effects for application in solution-processed OLEDs.

Results show that solution-processed poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS) HILs are susceptible to electron-induced degradation, a mechanism that can lead  to relatively short OLED electroluminescent (EL) lifetimes. This degradation can be minimized by selecting hole transporting materials and device structures that minimize electron leakage to the HIL, resulting in a lifetime improvement of up to 20x.

The effects of solvent and heat treatments on device efficiency and EL lifetime across a variety of hole injection and hole transport materials were found to vary considerably depending on the specific material combination. The extent of the morphological changes induced by the two treatments is highly material-dependent and does not necessarily correlate with device efficiency and EL lifetime. This suggests that additional, material-specific factors should be likely be considered in future correlations of device characteristics to the morphology of corresponding organic films for solution-processed devices.

Finally, solvent treatment of carbazole hole transport layers was found to induce substantial aggregation and lead to shorter EL lifetimes and lower device efficiency. The origin of this effect was found to be a decrease in photoluminescence quantum yield resulting from this aggregation.  Material intermixing was shown to suppress this aggregation and resulted in improved device efficiency and a 2.5x increase in EL lifetime.

 

Location 
E5
Room 4047
200 University Avenue West

Kitchener, ON N2L 3G1
Canada

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