Seminar - Daniel Janse van Rensburg

Thursday, August 20, 2015 2:30 pm - 2:30 pm EDT (GMT -04:00)


Mr. Daniel Janse van Rensburg, Nearfield Systems Inc., CA, USA


Factors Limiting the Upper Frequency of mm-Wave Spherical Near-field Test Systems


Antennas operating at mm-wave frequencies have led to the development of spherical near-field test systems that have to function at higher frequencies than before. This paper addresses some of the factors limiting the upper frequency bound of spherical near-field test systems in terms of what is practical with current technology. This includes mechanical positioning systems, RF sub-systems and the spherical near-field sampling requirements. Correction techniques that have been developed to enhance the performance of such measurement systems are also presented.

Speaker's biography

Daniel Janse van Rensburg has been working in the microwave test industry for the past 25 years. He specializes in microwave antenna measurement systems, computational electromagnetics and measurement uncertainty analysis. He graduated from the University of Pretoria, South Africa and was awarded the B. Eng, M. Eng and Ph.D. degrees in 1985, 1987 and 1991 respectively, all in Electrical Engineering. He is a Senior Member of the IEEE, Licensed Professional Engineer in Ontario, Canada and a Fellow of the Antenna Measurement Techniques Association (AMTA). Dr Janse van Rensburg is the recipient of the 2015 AMTA Distinguished Achievement Award for the development of near-field technology and is co-author of the IET text: Theory And Practice of Modern Antenna Range Measurements. He is employed by Nearfield Systems Inc, CA, USA and remains actively involved in academia. He serves as adjunct professor in the School of Information Technology and Engineering, University of Ottawa, Ottawa, ON, Canada.

Invited by professor S. Safavi-Naeini.