Hitachi S-3000N scanning electron microscope

Hitachi S-3000N Scanning Electron MicroscopeHitachi S-3000N scanning electron microscope (SEM) is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory of 1280x960 pixels and an advanced image capture and archiving system.

Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes by manipulating from each segment of the detector.

System specifications

  • 0.3 - 30kV acceleration voltage range
  • 5 nm resolution at 25kV in variable pressure mode
  • 150mm diameter maximum specimen size
  • Dual-bias for low voltage signal noise
  • Backscatter mode

User fees for Hitachi scanning electron microscope.