Characterization equipment

The Giga-to-Nanoelectronics (G2N) Centre has a wide variety of thin film, device and circuit characterization tools.

• Dektak 8 stylus profilometer
• Dimension 3100 scanning probe microscope
• Hitachi S-3000N scanning electron microscope
• Keithley 4200-SCS semiconductor characterization system
• FT-IR 8400S spectrometer
• UV-2501PC spectrometer
• Raman spectrometer
• Reichert polylite 88 microscope
• Stressgauge