The Giga-to-Nanoelectronics (G2N) Centre has a wide variety of thin film, device and circuit characterization tools. Dektak 8 stylus profilometer Bruker D8 Discover X-ray Diffraction Spectrometer Keithley 4200-SCS semiconductor characterization system FT-IR 8400S spectrometer UV-2501PC spectrometer Raman spectrometer Reichert polylite 88 microscope Stressgauge
The Giga-to-Nanoelectronics (G2N) Centre has a wide variety of thin film, device and circuit characterization tools. Dektak 8 stylus profilometer Bruker D8 Discover X-ray Diffraction Spectrometer Keithley 4200-SCS semiconductor characterization system FT-IR 8400S spectrometer UV-2501PC spectrometer Raman spectrometer Reichert polylite 88 microscope Stressgauge