Raffi Budakian: Probing Novel Nanomagnetic Phenomena with Ultrasensitive Force Detection
Raffi Budakian, University of Illinois at Urbana-Champaign
Abstract
Since the invention of the atomic force microscope (AFM) by Binnig, Quate and Gerber in 1986, force-based scanning probes have become an essential tool for imaging, manipulating and measuring materials on the nanometer scale. At the heart of the AFM is a mechanical sensor or cantilever that transduces the force generated between the probe tip and the sample into a displacement.