Keithley 4200-SCS semiconductor characterization system

Keithley 4200-SCS Semiconductor Characterization System

Keithley 4200-SCS semiconductor characterization system performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamper resolution (its unique Remote preAmps extend the resolution of SMUs to 0.1fA).

The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. It is used together with Cascade microtech probe station.

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