Grad Seminar: Open-loop Transient Atomic Force Microscopy
Abstract
The Atomic Force Microscope (AFM) is an instrument for measuring, in fact “seeing”, phenomena at nanoscale (10−9m) and all the way down to the atomic scale (<10−10m). It was borne out of a need to observe physical reality below the resolution of optical microscopes. Invented in 1986 by Binnig, it has aided scientists, researchers, and engineers spanning many scientific and industrial domains. The typical sensing apparatus of the AFM is a very sharp tip (a few atoms wide) attached to the free-end of a fixed-free micro-beam.