On May 31st, join Dr. Song Xu from Molecular Vista Inc for a presentation on AFM + Nanoscale vis-IR Spectroscopy via Photo-induced Force Microscopy technology.
Please note, this presentation will be held in-person in QNC 1501.
AFM + Nanoscale vis-IR Spectroscopy via Photo-induced Force Microscopy
Photo-induced Force Microscopy (PiFM) achieves nanoscale visible-infrared optical spectroscopy and atomic force microscopy (AFM) concurrently. With infrared (IR) excitation source, PiFM maps the IR absorption of the sample as a function of IR wavelength and position with sub-10 nm spatial resolution, highlighting (1) the locations of heterogeneous organic and inorganic materials and (2) the local chemical information via IR PiFM spectra, which show excellent correlation with bulk FTIR spectra on homogeneous samples. PiFM is surface sensitive with ~10 nm depth sensitivity, making it an excellent technique to complement other molecular analysis techniques such as nano-SIMS and XPS. Examples from various classes of samples including rock, plant, single molecules of protein, tissues, organic solar cells and semiconductors, and self-assembled monolayers (SAM) will be presented.