Manoj Sachdev

Professor, Electrical and Computer Engineering

Research interests: Digital circuit design for low power; Low voltage applications; High performance mixed-signal circuit design; Robust design practices for VLSI; Cybersecurity


Manoj Sachdev is a Professor and Interim Department Chair in the Department of Electrical and Computer Engineering at the University of Waterloo. His research interests include low power and high performance digital circuit design, mixed-signal circuit design, and test and manufacturing issues of integrated circuits. He has contributed to over 180 conference and journal publications, and has written 5 books. He also holds more than 30 granted US patents.

Professor Sachdev, along with his students and colleagues, have received several international research awards. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), and Fellow of the Engineering Institute of Canada. Professor Sachdev serves on the editorial board of the Journal of Electronic Testing: Theory and Applications. He is also a member of program of IEEE Custom Integrated Circuits Conference.


  • 1996, Doctorate, Electrical Engineering, Brunel University
  • 1984, Bachelor of Engineering, Electronics and Communication, University of Roorkee

Manoj Sachdev


Professor Sachdev's research interests include:

  • Digital circuit design for low power
  • low voltage applications
  • High performance mixed-signal circuit design
  • Robust design practices for VLSI
  • VLSI testing and design
  • VLSI quality
  • VLSI reliability
  • VLSI improvement techniques
  • Circuits Design & VLSI
  • Cybersecurity
  • Application security
  • Network security


  • Blackmore, Ewart and Trinczek, Michael and Jiang, Kai and Sachdev, Manoj and Wright, Derek, SRAM Dosimeter for Characterizing the TRIUMF Proton and Neutron Beams, IEEE Transactions on Nuclear Science, 2018
  • Neale, Adam and Sachdev, Manoj, Neutron Radiation Induced Soft Error Rates for an Adjacent-ECC Protected SRAM in 28 nm CMOS, IEEE Transactions on Nuclear Science, 63(3), 2016, 1912 - 1917
  • Shah, Jaspal Singh and Nairn, David and Sachdev, Manoj, A 32 kb Macro with 8T Soft Error Robust, SRAM Cell in 65-nm CMOS, IEEE Transactions on Nuclear Science, 62(3), 2015, 1367 - 1374
  • Papadopoulos, Nikolas P and Lee, Czang-Ho and Sachdev, Manoj and Wong, William S, Paper No P24: Effect of Mechanical Strain on Charge-Transfer VT-Shift Compensation Circuits for Flexible AMOLED Displays, SID Symposium Digest of Technical Papers, 46, 2015, 91 - 91
  • Neale, Adam and Jonkman, Maarten and Sachdev, Manoj, Adjacent-mbu-tolerant sec-ded-taec-yaed codes for embedded SRAMs, IEEE Transactions on Circuits and Systems II: Express Briefs, 62(4), 2015, 387 - 391
  • Pierce, I and Chuang, Jen and Sachdev, Manoj and Gaudet, Vincent C, A 167-ps 2.34-mW Single-Cycle 64-Bit Binary Tree Comparator With Constant-Delay Logic in 65-nm CMOS, IEEE Transactions on Circuits and Systems I: Regular Papers, 61(1), 2014, 160 - 171
  • Mohan, Nitin and Fung, Wilson and Wright, Derek and Sachdev, Manoj, A low-power ternary CAM with positive-feedback match-line sense amplifiers, IEEE Transactions on Circuits and Systems I: Regular Papers, 56(3), 2009, 566 - 573